 |
0 索取号:TN451/E801.r/1968 作者:Joint Conference on Thick Film Technology (1968 : Imperial College、 London)、Institution of Electronic and Radio Engineers.、Institution of Electrical Engineers.、International Society for Hybrid Microelectronics.、 出版社:London : Institution of Electronic and Radio Engineers, [1970].
|  |
0 索取号:TN406/E801 作者:IIT Research Institute.、Reliability Analysis Center (U.S.)、 出版社:Oxford ; New York : Pergamon Press, 1975, c 1976.
|
 |
0 索取号:TN4-62/E804 作者:Texas Instruments Incorporated. Semiconductor Group.、 出版社:Dallas : Texas Instruments, c1976.
|  |
0 索取号:TN4-62/E805 作者:Hamilton、 Thomas Daniel Scott.、 出版社:Maidenhead, Eng. : McGraw-Hill, c1977.
|
 |
0 索取号:TN4/E704/2 作者:Symposium on Hybrid Microelectronics (2nd : 1967 : Boston、 Mass.)、Woulbroun、 John M.、 1932-、Doyle、 George A.、IEEE Parts、 Materials、 and Packaging Group. Boston Chapter.、International Society for Hybrid Microelectronics.、 出版社:[Palo Alto] : International Society for Hybrid Microelectronics; [obtained from Western Periodicals Co., North Hollywood, Calif., 1967].
|  |
0 索取号:TN402-53/E902/1986 作者:IEEE International Conference on Computer-Aided Design (1986 : Santa Clara、 Calif.)、IEEE Computer Society.、IEEE Circuits and Systems Society.、IEEE Electron Devices Society.、ACM Special Interest Group on Design Automation.、 出版社:Washington, D.C. : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, c1986.
|
 |
0 索取号:TN202-62/E801.2 作者:Texas Instruments Incorporated. Semiconductor Group.、 出版社:Dallas, Tex. : Texas Instruments, 1975.
|  |
0 索取号:TN153-53/E803/1977 作者: 出版社:Bristol : Institute of Physics, 1977.
|
 |
0 索取号:TN153-53/E804/1972 作者:Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、 出版社:Chicago, Ill. : IITRI, 1972.
|  |
0 索取号:TN141-53/E801/1974 作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、 出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
|
 |
0 索取号:TN14-53/E801/11 作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、 出版社:San Francisco, Calif. : San Francisco Press, c1971.
|  |
0 索取号:TN14-53/E801/10 作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、 出版社:San Francisco : San Francisco Press, [c1969].
|
 |
0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
|  |
0 索取号:R595.4/E20031 作者:Platt、 Jerome J.、 出版社:Cambridge, Mass. : Harvard University Press, 1997.
|
 |
0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
|  |
0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
|